Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
Reexamination Certificate
2007-05-25
2008-12-09
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Chemical analysis
Reexamination Certificate
active
07463983
ABSTRACT:
A TOF mass spectrometer has a clock phase to time bin cycling device that distributes data among storage cells in a random or systematic pattern that cancels out errors due to binary clock path and/or binary signal line irregularities. Data for peaks acquired from plural shots during TOF analysis are distributed among plural binary clock paths and the storage cells such that errors from irregularities in the binary clock paths and/or binary signal lines are not predominant in any peak of a spectrum generated from the analysis.
REFERENCES:
patent: 4472631 (1984-09-01), Enke et al.
patent: 5995989 (1999-11-01), Gedcke et al.
patent: 6028543 (2000-02-01), Gedcke et al.
patent: 6094627 (2000-07-01), Peck et al.
patent: 6647347 (2003-11-01), Roushall et al.
patent: 6744044 (2004-06-01), Hidalgo et al.
patent: 6822227 (2004-11-01), Hidalgo et al.
patent: 6831280 (2004-12-01), Scherer
patent: 6878931 (2005-04-01), Roushall et al.
patent: 7084395 (2006-08-01), Fuhrer et al.
patent: 7129480 (2006-10-01), Roushall et al.
patent: 2004/0079877 (2004-04-01), Hidalgo et al.
patent: 2008/0040050 (2008-02-01), Hidalgo et al.
Allred David E.
Bhat Aditya S
Bui Bryan
Katz Charles B.
Thermo Finnigan LLC
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