Tire inspection apparatus and method

Details Tire inspection apparatus and method Tire inspection apparatus and method

2005-08-23

2005-08-23

Stafira, Michael P. (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

Surface condition

C356S520000

Reexamination Certificate

active

06934018

ABSTRACT:
Described is an anomaly detector apparatus10for detecting an anomaly in a tire comprising: a source of coherent light18to shine the light27directly onto the tire surface24and the light being reflected32from the tire; a stressing apparatus12which can stress the tire; a reflected light receiving apparatus40for receiving the light32reflected directly from the tire surface24when the tire is in a stressed and unstressed condition; a processor44which compares images of reflected light from the reflected light receiving apparatus40when the tire is stressed and unstressed thereby ascertaining an anomaly in the tire and generates an output from the comparison; and a display apparatus46electronically connected to the processor for displaying the output from the processor.

REFERENCES:
patent: 4506981 (1985-03-01), Hoff, Jr.
patent: 4887899 (1989-12-01), Hung
patent: 5065331 (1991-11-01), Vachon et al.
patent: 5473434 (1995-12-01), de Groot
patent: 5481356 (1996-01-01), Pouet et al.
patent: 5671050 (1997-09-01), de Groot
patent: 5760888 (1998-06-01), Rottenkolber
patent: 5826319 (1998-10-01), Colwell et al.
patent: 6006599 (1999-12-01), Kelm-Klager et al.
patent: 6012329 (2000-01-01), Kelm-Klager et al.
patent: 6041649 (2000-03-01), Fembock
patent: 6188482 (2001-02-01), Cloud
patent: 6188483 (2001-02-01), Ettemeyer
patent: 6268923 (2001-07-01), Michniewicz et al.
patent: 6285447 (2001-09-01), Parker et al.
patent: 6362873 (2002-03-01), Facchini et al.
patent: 6433874 (2002-08-01), Lindsay et al.
patent: 6493092 (2002-12-01), Marklund
patent: 6496254 (2002-12-01), Bostrom et al.
patent: 6522410 (2003-02-01), Marcus et al.
patent: 6542249 (2003-04-01), Kofman et al.
patent: 6556290 (2003-04-01), Maeda et al.
patent: 6584215 (2003-06-01), Mahner
patent: 6791695 (2004-09-01), Lindsay et al.
patent: 6840097 (2005-01-01), Huber et al.
Y, Y, Hung, etal Full-field Optical Strain Measurement having Postrecording Sensitivity and Direction Selectivity, Presented at 1975 SESA Spring Meeting, Chicago, IL May 11-16.
AST 4000 Series Shearography Tire Inspection Systems, Laser Technology Inc. of Norristown, PA dated Sep. 1996.

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