Tip position modulation and lock-in detection in scanning electr

Chemistry: electrical and wave energy – Processes and products – Processes of treating materials by wave energy

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G01N 2726

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active

053823362

ABSTRACT:
Small amplitude tip-position modulation (TPM) in combination with lock-in detection of the modulated current signal is applied to a scanning electrochemical microscope (SECM) to improve signal-to-noise ratio and to enhance image resolution. Phase shift information from the alternating current TPM signal and the bipolar response of TPM over insulators and conductors make TPM-SECM superior to conventional SECM imaging methods as well as useful for measuring substrate conductivity.

REFERENCES:
patent: 4747698 (1988-05-01), Wickramasinghe et al.
Bard, et al., "Chemical Imaging of Surfaces with the Scanning Electrochemical Microscope", Science, 254:68-74, (1991), Publ. Washington, D.C. no month available.
Bard, et al., "Scanning Electrochemical Microscopy: A New Technique for the Characterization and Modification of Surfaces", Acc. Chem. Res., 23:357-363, (1990), Publ. Washington, D.C. no month available.
Engstrom, et al., "Scanning Electochemical Microscopy", Anal. Chem., 61(19):1099A-1104A, (1989), Publ. Washington, D.C. no month available.
Wipf, et al., "Scanning Electrochemical Microscopy", J. Electrochem. Soc., 138(5):L4-L6, (1991), Publ. Pennington, N.J. no month available.
Wipf, et al., "Scanning Electrochemical Microscopy", J. Electochem. Soc., 138(2):469-474, (1991), Publ. Pennington, N.J. no month available.
Lee, et al., "Scanning Electrochemical Microscopy: Preparation of Submicrometer Electrodes", Anal. Chem., 63:78-83, (1991), Publ. Washington, D.C. no month available.
Kwak, et al., "Scanning Electochemical Microscopy. Theory of the Feedback Mode", Anal. Chem., 61:1221-1227, (1989), Publ. Washington, D.C. no month available.
Hieftje, G. M., "Signal-to-Noise Enhancement Through Instrumental Techniques", Anal. Chem., 44(6):81A-88A, (1972), Publ. Washington, D.C. no month available.
Kwak, et al., "Scanning Electrochemical Microscopy. Apparatus and Two-Dimensional Scans of Conductive and Insulating Substrates", Anal. Chem. 61:1794-1799, (1989), Publ. Washington, D.C. no month available.
Bard, et al., "Scanning Electrochemical Microscopy: Theory and Application of the Transient (Chronoamperometric) SECM Response", Anal. Chem., 63:1282-1288, (1991), Publ. Washington, D.C. no month available.
Unwin, et al., "Scanning Electrochemical Microscopy. Theory and Application of the Feedback Mode to the Measurement of Following Chemical Reaction Rates in Electrode Processes", J. Phys. Chem., 95:7814-7824, (1991), Publ. Washington, D.C. no month available.
Lee, et al., "Scanning Electrochemical Microscopy. Improvement of Image Resolution by Digital Processing Techniques", Anal. Chem., 63:2442-2447, (1991), Publ. Washington, D.C. no month available.
Binnig, et al., "Scanning Tunneling Microscopy", Helv. Phys. Acta, 55:726-735, (1982), Publ. Basel, Switzerland no month available.
Pashley, et al., "Scanning Tunnelling Microscope Studies", Surf. Sci., 152/153:27-32, (1985), Publ. Amsterdam, Netherlands no month available.
Binnig, et al., "Scanning Tunneling Microscopy", Surf. Sci., 126:236-244, (1983), Publ. Amsterdam, Netherlands no month available.
Wipf, et al., "Tip-Modulated Scanning Electrochemical Microscopy", Pittcon '92, (Book of Abstracts 944), (1992), Publ. New Orleans, La. no month available.

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