Tip coating system for scanning probe microscopy

Coating processes – Immersion or partial immersion

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118404, 118407, 118423, 118428, 118429, B05D 100

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060175907

ABSTRACT:
A tip coating system for use with scanning tunneling microscope (STM) tips. The tip coating system includes a tip holder, a plate having a slot for receiving the tip and for holding a coating material, a heater for heating the coating material into a molten blob, a micropositioner for displacing the plate to and from the tip and for moving the tip within the slot so that selected portions of the tip contact the molten blob of coating material. The tip coating system is preferably controlled by electronic controllers, including a temperature controller for the heater. The tip coating system is used to insulate the tips with soft polymer coating material to ensure very low tip leakage current (on the order of about 1 pA typical).

REFERENCES:
patent: 2559080 (1951-07-01), MacAllister
patent: 3524803 (1970-08-01), Rannefeld
patent: 4375396 (1983-03-01), Green et al.
patent: 4806755 (1989-02-01), Duerig et al.
patent: 4868396 (1989-09-01), Lindsay
patent: 4968390 (1990-11-01), Bard et al.
patent: 5035780 (1991-07-01), Suzuki et al.
patent: 5085746 (1992-02-01), Musselman et al.
patent: 5120959 (1992-06-01), Tomita
patent: 5145564 (1992-09-01), Lemke et al.
patent: 5155361 (1992-10-01), Lindsay
patent: 5178742 (1993-01-01), Lemke et al.
patent: 5202004 (1993-04-01), Kwak et al.
patent: 5258107 (1993-11-01), Yoshida et al.
patent: 5286355 (1994-02-01), Fainchtein et al.
patent: 5336369 (1994-08-01), Kado et al.
patent: 5345815 (1994-09-01), Albrecht et al.
patent: 5345816 (1994-09-01), Clabes et al.
patent: 5348638 (1994-09-01), Nakagawa
patent: 5353632 (1994-10-01), Nakagawa
patent: 5354985 (1994-10-01), Quate
patent: 5356218 (1994-10-01), Hopson et al.
patent: 5357109 (1994-10-01), Kusumoto
patent: 5360978 (1994-11-01), Gueret
patent: 5381101 (1995-01-01), Bloom et al.
patent: 5382456 (1995-01-01), Hocking et al.
patent: 5438206 (1995-08-01), Yokoyama et al.
patent: 5461907 (1995-10-01), Tench et al.
patent: 5468959 (1995-11-01), Tohda et al.
patent: 5481521 (1996-01-01), Washizawa et al.
patent: 5497000 (1996-03-01), Tao et al.
Bezanilla, et al., "Adsorption of DNA to Mica, Silylated Mica, and Minerals: Characterization by Atomic Force Microscopy," Langmuir, vol. II, No. 2, 1995, pp. 655-659.
Booth, et al., "Silica-supported Cyclopentadienyl-Rhodium (I),-Cobalt (I), and -Titanium (IV) Complexes," Journal of Organometallic Chemistry, 315 (1986), pp. 143-156.
Chalmers, et al., "Determination of tilted superlattics structure by atomic force microscopy," Applied Physics Letters 55(24), Dec. 1989, pp. 2491-2492.
Cricenti, et al., "Preparation and characterization of tungsten tips for scanning tunneling microscopy," Rev. Sci. Instrum. 65(5), May 1994, pp. 1558-1560.
Damaskin, et al., "The Adsorption of Organic Molecules," Institute of Electrochemistry, Academy of Sciences of the USSR, pp. 353-395.
DeRose, et al., "Comparative scanning probe microscopy study of the surface morphology of Au films grown from the vapor onto glass, fused silica and muscovite mica," Journal of Vacuum Science Technology, A 11 (4), Jul./Aug. 1993, pp. 776-780.
Fried, et al., "Gold-coated tungsten tips for scanning tunneling microscopy," Rev. Sci. Instrum. 64(6), Jun. 1993, pp. 1495-1497.
Frisbie, et al., "Functional Group Imaging by Chemical Force Microscopy," Science, vol. 265, Sep. 30, 1994, pp. 2071-2074.
Gorbunov, et al., "The use of silver tips in scanning tunneling microscopy," Rev. Sci. Instrum. 64 (8), Aug. 1993, pp. 2393-2394.
Hansma, et al., "Atomic force microscopy of DNA in aqueous solutions," Nucleic Acids Research, vol. 21, No. 3, 1993 pp. 505-512.
Huang, et al., "Experimental method for preparing nanometer scale Pd probe," Rev. Sci. Instrum. 64 (10), Oct. 1993, pp. 3022-3023.
Ibe, et al., "On the electrochemical etching of tips for scanning tunneling microscopy," Journal Vacuum Science Technology, A, vol. 8, No. 4, Jul./Aug. 1990, pp. 3570-3575.
Jarvis, et al., "A Novel Force Microscopy and Point Contact Probe," Dec. 1993, Rev. Sci. Instrum., vol. 64, No. 12, pp. 3515-3520.
Joyce, et al., "Mechanical Relaxation of Organic Monolayer Films Measured by Force Microscopy," Physical Review Letters, vol. 68, No. 18, May 4, 1992, pp. 2790-2793.
Lemke, et al., "Improved microtips for scanning probe microscopy," Rev.Sci. Instrum. 61 (10) Oct. 1990, pp. 2538-2541.
Lindsay, et al., "Scanning Tunneling Microscopy and Atomic Force Microscopy Studies of Biomaterials at a Liquid-Solid Interface," Jul./Aug. 1993, Journal Vacuum Science Technology, vol. 11, No. 4, pp. 808-815.
Lyubchenko, et al., "A technique for stable adhesion of DNA to a modified graphite surface for imaging by scanning tunneling microscopy," J. Va. Sci. Technol. B9(2) Mar./Apr. 1991, pp. 1288-1290.
Lyubchenko, et al., "Atomic Force Microscopy Imaging of Double Stranded DNA and RNA," Journal of Biomolecular Structure & Dynamics, vol. 10, issue No. 3 (1992) pp. 589-606.
Lyubchenko, et al., "Atomic force microscopy of reovirus dsRNA: a routine technique for length measurements," Nucleic Acids Research, vol. 20, No. 15 (1992) pp. 3983-3986.
Lyubchenko, et al., "Atomic force microscopy of DNA and bacteriophage in air, water and propanol: the role of adhesion forces," Nucleic Acids Research, vol. 21, No. 5 (1993), pp. 1117-1123.
Lyubchenko, et al., "Atomic force microscopy of long DNA: Imaging in air and under water," Proc. Natl., Acad. Sci. USA, vol. 90, Mar. 1993, pp. 2137-2140.
Lyubchenko, et al., "Atomic force microscopy imaging of large double stranded DNA molecules," The FASEB Journal, vol. 6, No. 1, Jan. 1, 1992, pp. 855-856.
Melmed, "The art and science and other aspects of making sharp tips," Journal Vacuum Science Technology, B 9 (2), Mar./Apr. 1991, pp. 601-608.
Musselman, et al., "Platinum/iridium tips with controlled geometry for scanning tunneling microscopy," Journal Vacuum Science Technology, A. vol. 8, No. 4, Jul./Aug. 1990, pp. 2558-2562.
Nagahara, et al., "Preparation and characterization of STM tips for electrochemical studies," Rev. Sci. Instrum., 60 (10), Oct. 1989, pp. 3128-3130.
Plueddermann, Edwin P., "Silane Coupling Agents," Plenum Press, 2nd edition, pp. cover-xi.
Rees, et al., "Evidence of DNA Bending in Transcription Complexes Imaged by Scanning Force Microscopy," Science, vol. 260, Jun. 11, 1994, pp. 1646-1649.
Schuelr, et al., "Creating and observing surface features with a scanning tunneling microscope," SPIE vol. 897, Scanning Microscopy Technologies and Applications (1988), pp. 16-19.
Sonnenfield, et al., "Semiconductor topography in aqueous environments: Tunneling microscopy of chemomechanically polised (001) GaAs," Appl. Phys. Letters 50 (24), Jun. 15, 1987, pp. 1742-1744.
Steitz, et al., "Structural studies of protein-nucleic acid interaction: the sources of sequence-specific binding," Quarterly Reviews of Biophysics 23, 3 (1990), pp. 205-280.
Stewart, et al., "Use of Magnetic Forces to Control Distance in a Surface Force Apparatus," Meas. Sci. Technol. (1990), vol. 1, pp. 1301-1303.
Thundat, et al., "Atomic Force Microscopy of DNA on MICA and Chemically Modified MICA," Scanning Microscopy, vol. 6, No. 4 (1992) pp. 911-918.
West, et al., "Chemical applications of scanning tunneling microscopy," IBM J. Res. Develop., vol. 30, No. 5, Sep. 1986, pp. 484-490.
Yang, et al., "Atomic force microscopy on DNA molecules," Federation of European Biochemical Societies, vol. 301, No. 2, Apr. 1992, pp. 172-176.
"Tips and Substrates for Scanning Probe Microscopy," corrected, Jul. 19, 1995.

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