Tip attachment for circuit probe tester

Details Tip attachment for circuit probe tester Tip attachment for circuit probe tester

1989-10-24

1990-12-18

Bradley, P. Austin

Electrical connectors

Alternatively connected

Coupling part

324158P, 324 725, 439482, 439841, 439909, H01R 1118

Patent

active

049783122

ABSTRACT:
The attachment consists of a single length of resilient wire formed into a coil spring portion, a probe engaging portion and an elongated tip portion. The tip portion extends forwardly from the coil spring portion in a direction generally parallel to the probe and has a uniform cross-sectional dimension throughout its length. A radially extending portion of the wire is bent to form a recess adapted to engage the insulated wire of the probe, so as to retain the attachment when not in use.

REFERENCES:
patent: 2581116 (1952-01-01), Lewis
patent: 3058083 (1962-10-01), Schneider
patent: 3676776 (1972-07-01), Bauer et al.
patent: 3885848 (1975-05-01), Brouneus
patent: 4000745 (1977-01-01), Goldberg
patent: 4178058 (1979-12-01), Swenson
patent: 4620763 (1986-11-01), Mochida
patent: 4632496 (1986-12-01), Williams
patent: 4716365 (1987-12-01), Pool
patent: 4740746 (1988-04-01), Pollock et al.

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