Tip and tip assembly for a signal probe

Details Tip and tip assembly for a signal probe Tip and tip assembly for a signal probe

2005-08-30

2005-08-30

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010

Reexamination Certificate

active

06937039

ABSTRACT:
A signal probe includes a tip assembly having a first tip for contacting a first signal node, a second tip for contacting a second signal node, and a tip body for positioning the first tip a distance away from the second tip, the distance corresponding to the spacing between the first and second signal nodes. With the tip body, a technician no longer has to couple a wire between one of the signal nodes and a respective tip to probe the electronic device. Thus, the length of the path that a signal travels from the first signal node to the second signal node may be reduced to increase the accuracy of the signal's measurement.

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patent: 6759858 (2004-07-01), Roggel
patent: 6828768 (2004-12-01), McTigue

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