Timing variation measurement system and method

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S069000, C702S078000, C702S079000, C702S104000, C327S158000, C327S250000, C324S076540

Reexamination Certificate

active

10890072

ABSTRACT:
The present invention is a system and method that facilitates measurement of timing variations (e.g., timing delays) in a semiconductor chip. The timing variations are measured and presented as digital values without extensive off chip measurement and analysis equipment. The timing variation measurements provides insight into timing variations (e.g., delays) inside a semiconductor chip and across different chips, including timing impacts experienced in end use after manufacturing. A timing variation measurement system includes a variation test signal generator for passing a signal through a portion of a circuit and generating a variation test signal. A variation test signal tracking component digitally counts cycles in a variation test signal and a control component controls the counting (e.g., the length of time the cycles are counted). Timing variation information, including a digital value associated with the variation test signal cycle count, can be communicated via pins and/or a processor interface.

REFERENCES:
patent: 5923676 (1999-07-01), Sunter et al.
patent: 6437619 (2002-08-01), Okuda et al.
patent: 6597753 (2003-07-01), Okayasu et al.
patent: 6606575 (2003-08-01), Miller
patent: 6807243 (2004-10-01), Okayasu et al.
patent: 6850051 (2005-02-01), Roberts et al.
patent: 2002/0049554 (2002-04-01), Miller
patent: 2002/0180500 (2002-12-01), Okuda et al.
patent: 2003/0006750 (2003-01-01), Roberts et al.
patent: 2003/0194038 (2003-10-01), Okayasu et al.
patent: 2005/0028050 (2005-02-01), Ganry
patent: 2005/0036578 (2005-02-01), Heidel et al.
patent: 2005/0204211 (2005-09-01), Gouin et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Timing variation measurement system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Timing variation measurement system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Timing variation measurement system and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3850659

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.