Timing variation measurement system and method

Details Timing variation measurement system and method Timing variation measurement system and method

2007-02-27

2007-02-27

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Measured signal processing

C702S069000, C702S078000, C702S079000, C702S104000, C327S158000, C327S250000, C324S076540

Reexamination Certificate

active

10890072

ABSTRACT:
The present invention is a system and method that facilitates measurement of timing variations (e.g., timing delays) in a semiconductor chip. The timing variations are measured and presented as digital values without extensive off chip measurement and analysis equipment. The timing variation measurements provides insight into timing variations (e.g., delays) inside a semiconductor chip and across different chips, including timing impacts experienced in end use after manufacturing. A timing variation measurement system includes a variation test signal generator for passing a signal through a portion of a circuit and generating a variation test signal. A variation test signal tracking component digitally counts cycles in a variation test signal and a control component controls the counting (e.g., the length of time the cycles are counted). Timing variation information, including a digital value associated with the variation test signal cycle count, can be communicated via pins and/or a processor interface.

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