Timing generator, test apparatus and skew adjusting method

Details Timing generator, test apparatus and skew adjusting method Timing generator, test apparatus and skew adjusting method

2007-04-10

2007-04-10

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S079000, C713S503000

Reexamination Certificate

active

11197118

ABSTRACT:
There is provided a timing generator generating a timing signal of a predetermined period. The timing generator includes a set/reset latch, a set unit supplying the set signal, and a reset unit supplying the reset signal, in which the set unit includes: a first variable delay circuit that delays a given reference clock to output a first set signal; a second variable delay circuit that delays the given reference clock to output a second set signal having a phase different from the first set signal; an OR circuit that computes a logical sum of the first set signal and the second set signal to generate the set signal; and a third variable delay circuit that delays the set signal output from the OR circuit to adjust a skew between the set signal and the reset signal.

REFERENCES:
patent: 5280195 (1994-01-01), Goto et al.
patent: 6324142 (2001-11-01), Ishitoya et al.
patent: 6574579 (2003-06-01), Watanabe

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