Timing generator, semiconductor test apparatus, and timing...

Details Timing generator, semiconductor test apparatus, and timing... Timing generator, semiconductor test apparatus, and timing...

2005-09-06

2005-09-06

Callahan, Timothy P. (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Having specific delay in producing output waveform

C327S262000, C327S286000

Reexamination Certificate

active

06940330

ABSTRACT:
A timing generator includes a reference signal generating unit for generating a reference signal of a predetermined frequency, a variable delay circuit unit for outputting the timing signal which results from delaying the reference signal by a predetermined time, and a delay amount measuring unit for measuring a delay amount of the variable delay circuit unit, whereby the timing generator controls the delay amount of the variable delay circuit unit based on the delay amount measured by the delay amount measuring unit. Since the frequency of the reference signal is continuously modulated within a very small frequency range, the delay amount measuring unit can measure the delay amount of the variable delay circuit unit highly accurately. In addition, since the delay amount of the variable delay circuit unit can be controlled on the basis of the measured delay amount, it is possible to generate the accurately delayed timing signal.

REFERENCES:
patent: 5488325 (1996-01-01), Sato et al.
patent: 5604468 (1997-02-01), Gillig
patent: 5712582 (1998-01-01), Yokota et al.
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patent: 9-304488 (1997-11-01), None
Patent Abstracts of Japan; Publication No. 09-304488 dated Nov. 28, 1997 (1 pg).
International Search Report mailed Feb. 12, 2003 (2 pgs.).

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