Timing generator intended for semiconductor testing apparatus

Details Timing generator intended for semiconductor testing apparatus Timing generator intended for semiconductor testing apparatus

1994-10-18

1996-01-30

Westin, Edward P.

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Having specific delay in producing output waveform

327279, 326 93, H03K 5135

Patent

active

054883253

ABSTRACT:
A timing generator for generating delay timing signals which have delay time up to n-times of a reference clock period is capable of considerably reducing the hardware size. The timing generator is used in a semiconductor testing apparatus. The timing generator can contribute to reduce the total size and cost of the semiconductor testing apparatus. The timing generator includes a counter for counting the reference clock, an adder for adding the output of the counter to delay data, a series of registers for storing the output of the adder and shifting the output of the adder in synchronism with a delay trigger signal, a series of exclusive OR gates for comparing each output of the registers with the output of the counter and generating coincidence signals when the output from the register and the counter coincide with each other, and an OR gate for receiving the outputs of the exclusive OR gates and generating a signal which is combined of the outputs from the exclusive OR gates.

REFERENCES:
patent: 4400666 (1983-08-01), Sekiguchi
patent: 4745310 (1988-05-01), Swapp
patent: 4837521 (1989-06-01), Herlein et al.
patent: 5095232 (1992-03-01), Hirano et al.
patent: 5418479 (1995-05-01), Sambandain

Affiliated with

Also associated with

Rating

Timing generator intended for semiconductor testing apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Timing generator intended for semiconductor testing apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Timing generator intended for semiconductor testing apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-158619