Timing generator for testing IC

Details Timing generator for testing IC Timing generator for testing IC

1996-03-22

1997-12-30

Callahan, Timothy P.

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Clock or pulse waveform generating

327172, 327298, 327291, H03K 504

Patent

active

057035156

ABSTRACT:
A timing generator which receives a rate signal and generates an output signal based on the rate signal, and comprises at least two delay lines for causing delays in the rate signal, a formatter for receiving signals from the delay lines and for determining the rise and fall of an output signal according to such signals from the delay lines, and for generating an output signal, memories for storing delay time data from the delay lines, and a data selector for taking the delay time data from the memories and to switch the delay time data, whereby accurate timing signals are generated utilizing short skew adjustment time.

REFERENCES:
patent: 4564953 (1986-01-01), Werking
patent: 5208598 (1993-05-01), Lueker et al.
patent: 5406132 (1995-04-01), Housako
patent: 5430737 (1995-07-01), Yamashita et al.
patent: 5465066 (1995-11-01), Yamashita et al.
patent: 5590137 (1996-12-01), Yamashita et al.

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