Timing generation in an automatic electrical test system

Details Timing generation in an automatic electrical test system Timing generation in an automatic electrical test system

1992-09-11

1994-05-10

Miska, Vit W.

Horology: time measuring systems or devices

Combined with disparate device

368113, 324 731, 324158R, 371 151, 371 221, G04B 4700, G04F 800, G01R 3128

Patent

active

053114868

ABSTRACT:
A method and apparatus for generating timing markers in an automatic electrical test system. Timing parameters are synchronized by an external period start signal corresponding to a centrally generated external period and an internal period start signal generated locally for each input/output pin. The timing parameters comprise T1 counter and vernier values, T2 counter and vernier values, and period-minus-T1 counter and period vernier values.

REFERENCES:
patent: 4070565 (1978-01-01), Borrelli
patent: 4108358 (1978-08-01), Niemasztk et al.
patent: 4792932 (1987-01-01), Bowllers et al.
patent: 4994732 (1991-02-01), Jeffrey et al.
patent: 5212443 (1993-05-01), West et al.
patent: 5254942 (1993-10-01), D'Souza et al.

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