Timing functions to optimize code-execution time

Details Timing functions to optimize code-execution time Timing functions to optimize code-execution time

2011-02-15

2011-02-15

Cosimano, Edward R (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Including program set up

C073S865900, C324S500000, C324S537000, C702S117000, C702S182000

Reexamination Certificate

active

07890288

ABSTRACT:
A method and system for optimizing a test plan of an Integrated Circuit (IC). The test plan includes two or more test sequences. A test sequence includes the measurement of a parameter of the IC. The total test time of the IC is reduced by performing one or more activities during a desired wait time associated with the measurement of the parameter. The test plan may be further optimized by modifying the one or more activities performed during the desired wait time.

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