Timing calibration circuit and method for test signals

Details Timing calibration circuit and method for test signals Timing calibration circuit and method for test signals

1995-08-22

1997-12-30

Brown, Glenn W.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Calibration

324130, 324 7654, 324 7663, 324 7674, 36457101, G01R 3500, G01R 2500

Patent

active

057034893

ABSTRACT:
A timing calibration circuit includes a plurality of variable delay circuits each of which is assigned to one of test signal paths to regulate a phase delay time for a signal passing therethrough, a multiplexer for selecting one of the test signal paths whose inputs are connected to outputs of drivers, a signal path whose one end is connected to all of test contactors and the other end is connected to the multiplexer, a counter for measuring phase delay times in a first feedback loop which does not include the signal path and a second feedback loop which includes the signal path with respect to each of the test signal paths. The counter measures a phase delay time for the first feedback loop to determine a reference value so that a phase delay time in the first feedback loop for other test signal paths is adjusted by the variable delay circuit to be equal to the reference value, and the counter measures a phase delay time for the second feedback loop to determine a calibration value for each of the test signal paths and record the calibration value.

REFERENCES:
patent: 4829236 (1989-05-01), Brenardi et al.
patent: 5471145 (1995-11-01), Mydill
patent: 5539304 (1996-07-01), Payne et al.

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