Timing apparatus and timing method for wrapper cell speed path t

Details Timing apparatus and timing method for wrapper cell speed path t Timing apparatus and timing method for wrapper cell speed path t

1997-02-03

1998-06-30

Canney, Vincent P.

Excavating

G06F 1100

Patent

active

057744769

ABSTRACT:
Wrapper cells (16 and 18) are coupled to inputs and outputs of an embedded core (14) within an integrated circuit (10). The wrapper cells (16 and 18) are used to test timing specifications of the embedded core after the embedded core has been integrated on-chip with other peripheral logic (12). In order to accurately measure the timing specifications, test circuits (FIGS. 6-8) are formed on chip with the wrapper where the test circuits are used to measure clock skew a like internal integrated circuit (IC) parameters. The clock skew and other measured internal IC parameters are used to accurately test the timing specification of the embedded core with reduced uncertainty.

REFERENCES:
patent: 5054024 (1991-10-01), Whetsel
patent: 5220281 (1993-06-01), Matsuki
patent: 5229657 (1993-07-01), Rackley
patent: 5260947 (1993-11-01), Posse
patent: 5260949 (1993-11-01), Hashizume et al.
patent: 5260950 (1993-11-01), Simpson et al.

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