Timing analysis using statistical on-chip variation

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C716S106000

Reexamination Certificate

active

07992114

ABSTRACT:
A statistical on-chip variation approach to timing analysis permits the automated or semi-automated selection of design-specific margins without requiring complex statistical libraries. By separately addressing the impact of random and systematic variations on timing, a design-specific margin can be obtained and used in downstream OCV analysis. In addition, where statistical libraries are available for some portions of a design, these can be incrementally included in the timing analysis to obtain more accurate results.

REFERENCES:
patent: 7487475 (2009-02-01), Kriplani et al.
patent: 2006/0059446 (2006-03-01), Chen et al.
patent: 2006/0090150 (2006-04-01), Kucukcakar et al.
patent: 2006/0107244 (2006-05-01), Yonezawa
patent: 2008/0010558 (2008-01-01), Ikeda
patent: 2008/0222586 (2008-09-01), Homma et al.
patent: 2008/0270962 (2008-10-01), Chadwick et al.
Chang, Keh-Jeng “Accurate on-chip variation modeling to achieve design for manufacturability”,From Proceedings of the 4th IEEE International Workshop on System-on-Chip for Real-Time Applications(IWSOCÂ?04), (Jul. 2004),219-222.
Devgan, Anirudh et al., “Block-based static timing analysis with uncertainty”,From the conference ICCAD '03in San Jose, CA, (Nov. 13, 2003),607-614.
Tseng, Ken et al., “Cell model creation for statistical timing analysis”,Available onlinehttp://www.eetimes.com/showArticle.jhtml?articleID=190100003, (Jul. 3, 2006),1-5.
Hong, Jerry et al., “An LLC-OCV Methodology for Statistic Timing Analysis”,From IEEE 2007, (Apr. 27, 2007),1-4.
Nardi, A et al., “Use of Statistical Timing Analysis on Real Designs”,From Design, Automation&Test in Europe Conference&Exhibition, 2007., (Apr. 20, 2007),1-6.
Mutlu, Athan et al., “An Exploratory Study on Statistical Timing Analysis and Parametric Yield Optimization”,From ISQED '07. 8th International Symposiumon, Date: Mar. 26-28, 2007, (Mar. 28, 2007),677-684.
Tuncer, Emre et al., “Filtering Methods for Statistical Static Timing Analysis”, From U.S. Appl. No. 11/451,705, filed Jun. 12, 2006, 1/41.
Tuncer, Emre et al., “Aggregate Sensitivity for Statistical Static Timing Analysis”, From U.S. Appl. No. 11/451,905, filed Jun. 12, 2006, 1-38.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Timing analysis using statistical on-chip variation does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Timing analysis using statistical on-chip variation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Timing analysis using statistical on-chip variation will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2781703

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.