Time-to-flight mass spectrometers and convergent lenses for ion

Radiant energy – Ionic separation or analysis – Ion beam pulsing means with detector synchronizing means

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250281, B01D 5944, H01J 4900

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06057545&

ABSTRACT:
The present invention relates to time-of-flight mass spectrometers that use a pulser to provide an orthogonal acceleration to a continuous flow of a beam of ions so as to cause a packet of ions to flow out into an orthogonal direction and enter a detector. The invention makes the size of the emission outflow aperture of a pulser in the direction of the continuous flow of ions greater than the size of the aperture of the ion detector in the direction of the continuous flow of ions. In particular, the size of the ion emission aperture is at least twice as large as the size of the aperture of the detector.

REFERENCES:
patent: 5343624 (1994-09-01), Symons
patent: 5420423 (1995-05-01), Linden
patent: 5481107 (1996-01-01), Takada et al.
patent: 5637869 (1997-06-01), Bergmann
patent: 5654543 (1997-08-01), Li
patent: 5663560 (1997-09-01), Sakairi et al.
patent: 5825025 (1998-10-01), Kerley
"An Inductively Coupled Plasma-Time-of-Flight Mass Spectrometer for Elemental Analysis" D.P. Myers, G. Li, P.P. Mahoney, and G.M. Hieftje J.Am.Soc Mass Spectorom, 1995, vol. 6, pp. 400-410.
"Preliminary Design Considerations and Characteristics of an Inductively Coupled Plasma-Time-of-Flight Mass Spectrometer" D.P. Myers and G.M. Hieftje Microchemical Journal, 1993, vol. 48, pp. 259-277.
"252 Cf Plasma Desorption Mass Spectrometry Using a Mamyrin Reflection in a Low Voltage Regime" Paul W. Geno and R.D. Macfarlene International Journal of Mass Spectrometry and Ion Processes, 1987, vol. 77, pp. 75-94.
"Laser Assisted Reflection Time-of-Flight Mass Spectrometry", B.A. Mamyrin International Journal of Mass Spectrometry and Ion Processes, 1994, vol. 131, pp. 1-19.
English abstract of Japanese patent publication No. 08-007831.

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