Time-of-flight measuring device

Details Time-of-flight measuring device Time-of-flight measuring device

2011-08-23

2011-08-23

Nguyen, Khai M (Department: 2819)

Coded data generation or conversion

Digital code to digital code converters

Unnecessary data suppression

C341S065000, C341S067000, C250S282000, C250S287000

Reexamination Certificate

active

08004432

ABSTRACT:
A time-of-flight measuring device for performing a hardware-based high-speed data compression process before transferring the data from a signal recorder to a data processor is provided. A time-series digital signal recorded by a signal recorder is converted to a plurality of time-series digital signals by being divided into a bit string including baseline information and a bit string not including the baseline information. Then, the time-series digital signal consisting of a bit string not including the baseline information is compressed by run-length encoding, such as zero length encoding or switched run-length encoding. Subsequently, static Huffman coding is performed on each of the time-series digital signals to reduce the data amount.

REFERENCES:
patent: 4626829 (1986-12-01), Hauck
patent: 5367162 (1994-11-01), Holland et al.
patent: 6627877 (2003-09-01), Davis et al.
patent: 6737642 (2004-05-01), Syage et al.
patent: 6765199 (2004-07-01), Youngquist et al.
patent: 6940066 (2005-09-01), Makarov et al.
patent: 7084393 (2006-08-01), Fuhrer et al.
patent: 2006/0248942 (2006-11-01), Oonishi et al.
patent: 2000-299083 (2000-10-01), None
patent: 2002-511211 (2002-04-01), None
patent: 2003-216190 (2003-07-01), None
patent: 2006-236795 (2006-09-01), None
patent: 98/54847 (1998-12-01), None
patent: 03/042979 (2003-05-01), None
Koichi Tanaka, “Matorikkusu Shien Rehzah Datsun Ionka Shitsuryou Bunsekihou (Matrix Assisted Laser Desorption/Ionization Mass Spectrometry)”, Bunseki, (1996), pp. 253-261, vol. 4.
Benjamin M. Chien, et al., “The design and performance of an ion trap storage-reflectron time-of-flight mass spectrometer”, International Journal of Mass Spectrometry and Ion Processes, (1994), pp. 149-179, vol. 131.

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