Time-of-flight mass-spectrometer with gasphase ion source, with

Details Time-of-flight mass-spectrometer with gasphase ion source, with Time-of-flight mass-spectrometer with gasphase ion source, with

1994-07-01

1996-03-05

Berman, Jack I.

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

250284, H01J 4940

Patent

active

054969980

ABSTRACT:
A high particle density in the extraction volume of a gasphase ion source and simultaneously a very low particle density in the driftspace of the time-of-flight mass-spectrometer are necessary for high sensitivity and a large dynamic range of the mass-spectrometer signal output. This can be achieved by separating the time-of-flight mass-spectrometer into two or more regions of different pressure, connecting the different regions by gas flow restrictions. A maximum particle density in the extraction volume and simultaneously a minimal particle density in drift space can be achieved by integrating the gas flow restrictions(3,6) directly into the electrodes(1,2) of the ion source.

REFERENCES:
patent: 3553452 (1971-01-01), Tiernan et al.
patent: 5298743 (1994-03-01), Kato
I. R. King & J. T. Scheurich, Identification of Flame Ions by TOF Mass Spectrometry, Rev. Scientific Instrum. 37 (1966) 1219-1223.
C. Ma, S. M. Michael, M. Chien, J. Zhu, & D. Lubman, The Design of an Atomspheric Pressure Ionization/Time-of-Flight Mass Spectrometer Using a Beam Deflection Method, Rev. Sci. Instrum 63 (1), Jan. 1992, pp. 139-148.
T. Bergmann, T. P. Martin & H. Schaber, High Resolution Time-of-Flight Mass Spectrometer, Rev. Sci. Instrum. 60(4), Apr. 1989, pp. 792-793.

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