Time-of-flight mass spectrometer with an aperture enabling trade

Details Time-of-flight mass spectrometer with an aperture enabling trade Time-of-flight mass spectrometer with an aperture enabling trade

1991-04-25

1994-04-05

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

250288, B01D 5944, H01J 4900

Patent

active

053007743

ABSTRACT:
A time-of-flight mass spectrometer in which sample ions are generated from a target and are focussed into an ion beam that is incident onto a detector. A barrier that defines an aperture in the path of the ion beam is positioned to block ions having an extra large deviation from an average time-of-flight of the ions, thereby improving resolution. The aperture can be adjusted to adjust a tradeoff between sensitivity and resolution. Alternatively, the position of the aperture or the bias on an einzel lens can be adjusted to control this resolution.

REFERENCES:
patent: 3727047 (1973-04-01), Janes
patent: 3936693 (1976-02-01), Parks et al.
patent: 4107527 (1978-08-01), Cherepin et al.
patent: 4625112 (1986-11-01), Yoshida
patent: 4740692 (1988-04-01), Yamamoto et al.

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