Time of flight mass spectrometer and dual gain detector...

Radiant energy – Ionic separation or analysis – Ion beam pulsing means with detector synchronizing means

Reexamination Certificate

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C250S283000

Reexamination Certificate

active

06756587

ABSTRACT:

BACKGROUND OF THE INVENTION
This invention relates to a time-of-flight mass spectrometer and its associated ion detection system. It provides apparatus for detecting ions in a time-of-flight mass spectrometer, and methods of operating that apparatus, which result in improved performance at a lower cost when compared with prior spectrometers.
In a time-of-flight mass spectrometer, a bunch of ions enters a field-free drift region with the same kinetic energy and the ions temporally separate according to their mass-to-charge ratios because they travel with different velocities. Ions having different mass-to-charge ratios therefore arrive at a detector disposed at the distal end of the drift region at different times, and their mass-to-charge ratios are determined by measurement of their transit time through the drift region.
Prior detectors for time-of-flight mass spectrometers comprise an ion-electron converter followed by an electron multiplying device. In some embodiments, ions strike a surface of the multiplying device to release electrons and a separate converter is not provided. Because the detector must respond to ions leaving the whole exit aperture of the drift region, it is conventional to use one or more microchannel plate electron multipliers as the multiplying device. A collector electrode is disposed to receive the electrons produced by the microchannel plates and means are provided to respond to the current flow so generated and produce an output signal. The chief difference between such a detector and the similar device conventionally used with magnetic sector, quadrupole or quadrupole ion-trap spectrometers is the electronic signal processing, which must produce signals indicative of the transit time of the ions as well as the number arriving in any particular time window (corresponding to one or more mass-to-charge ratios). This data must be generated and read out before the next bunch of ions can be admitted into the drift region, so that detector speed is an important determinant of the repetition rate, and hence the sensitivity, of the entire spectrometer.
The earliest detectors for time-of-flight spectrometers comprised a DC amplifier connected to the collector electrode and an analogue-to-digital converter (ADC) for digitizing the output of the amplifier. Usually, this arrangement was used with time-slice detection whereby the amplifier was gated to respond only to ions arriving within a certain time window (typically corresponding to one mass unit). The time window was moved (relative to the time of entrance of ions into the drift region) during repeated cycles of operation so that a complete mass spectrum was eventually recorded. An improvement involved the use of several amplifiers and ADC's arranged to simultaneously record a different time window. Nevertheless, many cycles of the spectrometer are still required to record a complete mass spectrum and the repetition rate of the spectrometer is severely limited by the time taken for the analogue-digital conversion in each cycle. Digital transient recorders (for example, as described in U.S. Pat. Nos. 4,490,806, 5,428,357 and PCT applications WO94/28631 and WO95/00236) have been devised to efficiently process the digital data produced by the ADC, but, particularly in the case of time-of-flight mass analyzers for the analysis of ions from continuous (as opposed to pulsed) ion sources, these do not represent a cost-effective solution to the problem of achieving a high repetition rate.
An alternative detection system for time-of-flight mass spectrometers is based on ion counting. In these methods, a signal due to a single ion impact on the detector is converted to a digital boolean value, “true” (which may be represented by a digital “1”) in the case of an ion impact, or “false” (e.g, a digital “0”) if there has been no ion impact. Various types of timers and/or counters are then employed to process the digital data produced. For example, a counter associated with a particular time window may be incremented whenever a signal is generated in that time window. Alternatively, the output of a timer, started when an ion bunch enters, may be stored in a memory array whenever the detector generates a “true” signal. The advantage of an ion-counting detector over an analogue detector is that variations in the output signal of the electron multiplier due to a single ion impact, which may be ±50% or more, are effectively eliminated because each signal above the noise threshold is treated identically. Further, an ion counting detector does not suffer from the additional noise inevitably produced by the ADC incorporated in an analogue detector system, and is also faster in operation. Consequently, the contribution of noise to the overall ion count is reduced and a more accurate ion count is achieved, particularly in the case of small numbers of ions. The disadvantage is that the digital signal representing an ion impact must be processed very quickly, before the next ion arrives at the detector, if that ion is to be detected. In practice, all detectors have a deadtime immediately following an ion impact, during which they cannot respond to an ion impact. This limits the number of ions which can be detected in a given time, so that a dynamic range of the detector is also limited. Corrections can be made to the detector output to compensate for the effects of deadtime (see, for example, Stephen, Zehnpfenning and Benninghoven, J. Vac. Sci. Technol. A, 1994 vol 12 (2) pp 405-410), and in corresponding EP patent application claiming priority solely from GB 9801565.4 filed Jan. 23, 1998 (Agents Ref: 80.85.67750/004), but even when such corrections are carried out the detector dynamic range still effectively reduces the performance of a time-of-flight mass spectrometer with such a detector.
An improved ion-counting detector for time-of-flight mass spectrometry has been described in general terms by Rockwood at the 1997 Pittsburgh Conference, Atlanta, Ga. (paper No 733), and is available commercially from Sensar Larsen-Davis as the “Simulpulse” detector. According to information published by Sensar Larson-Davis it comprises a large number of individual equal-area anodes, each of which is provided with a digital pulse generating circuit which is triggered by the arrival of an ion at its associated anode. The anodes are disposed in a wide-area detector so that they are all equally likely to be struck by an ion exiting from the drift region. Consequently, simultaneous (or near-simultaneous) ion strikes are most likely to occur on different electrodes and the effect of detector deadtime is greatly reduced. The data from each of the anodes is summed into an 8-bit digital word representative of the ion intensity at any particular time, and the value of that word and its associated time is stored in a digital memory. However, such a detector is obviously complicated and expensive to manufacture.
An electron multiplier ion detector for a scanning mass spectrometer which has two modes of operation to extend its dynamic range is disclosed by Kristo and Enke in Rev. Sci. Instrum. 1988 vol 59 (3) pp 438-442. This detector comprises two channel type electron multipliers in series together with an intermediate anode. The intermediate anode was arranged to intercept approximately 90% of the electrons leaving the first multiplier and to allow the remainder to enter the second multiplier. An analogue amplifier was connected to the intermediate anode and a discriminator and pulse counter connected to an electrode disposed to receive electrons leaving the second multiplier. The outputs of the analogue amplifier and pulse counter were electronically combined. A protection grid was also disposed between the multipliers. At high incident ion fluxes, the output signal comprised the output of the analogue amplifier connected to the intermediate anode. Under these conditions a potential was applied to the protection grid to prevent electrons entering the second multiplier (which might otherwise cause damage to the second multiplier). At low

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