Time-of-flight mass spectrometer

Radiant energy – Ionic separation or analysis – Ion beam pulsing means with detector synchronizing means

Reexamination Certificate

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C250S297000, C313S1030CM

Reexamination Certificate

active

07999222

ABSTRACT:
A time-of-flight mass spectrometer includes a detector and is adapted to measure the time it takes for an accelerated ion to reach the detector and thereby measure the mass of the ion. The time-of-flight mass spectrometer scans a voltage applied to an ion incident side surface of the detector in accordance with a mass to be measured. An electrode is provided between the detector and a space in which an ion flies. The time-of-flight mass spectrometer is capable of measuring ions of a wide range of masses with high detection efficiency by scanning a voltage applied to the electrode.

REFERENCES:
patent: 3885180 (1975-05-01), Carts, Jr.
patent: 6906318 (2005-06-01), Bateman et al.
patent: 7047144 (2006-05-01), Steiner
patent: 7564043 (2009-07-01), Hayashi et al.
patent: 2004/0227070 (2004-11-01), Bateman et al.
patent: 2008/0116368 (2008-05-01), Uchiyama et al.
patent: 2008/0230686 (2008-09-01), Suzuki et al.
patent: 2001-351565 (2001-12-01), None
patent: 2001-351566 (2001-12-01), None
patent: 2005-298603 (2005-10-01), None

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