Time-of-flight mass spectrometer

Details Time-of-flight mass spectrometer Time-of-flight mass spectrometer

1995-05-04

1997-03-25

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

250282, B01D 5944, H01J 4900

Patent

active

056147112

ABSTRACT:
A novel, time-of-flight mass spectrometer for the qualitative and quantitative analysis of elemental, molecular, and isotopic chemical samples is provided which offers increased sensitivity, speed of analysis, resolving power, and signal-to-noise ratios than prior mass spectrometers by properly sampling and collimating an ion beam from a continuous ion source, decelerating said ion, forming ion packets from the continuous ion beam, storing said ion packets, extracting and accelerating the ion packets along a stable flight path, transversely compressing said packets, focusing ions of similar mass, and detecting the focused ion masses. The mass spectrometer includes an ion optics assembly and an analyzer disposed along a common axis coincident with a continuous beam of sampled ions. The relationship between the ion extractor and accelerator are such that ions of isomass are focused at at least one point in space in the analyzer along a narrow flight path so as to be either removed from the flight path or allowed to proceed and be detected at substantially the same time. The separate modulation and extraction steps, when coupled with the space-focusing and selected deflection of certain ionic species, results in higher sensitivity, greater analysis speed, higher resolving power, and improved signal-to-noise ratio than achieved in prior orthogonal or on-axis time-of-flight mass spectrometers. A novel method achieved by the apparatus is also disclosed.

REFERENCES:
patent: 3634683 (1972-01-01), Bakker
patent: 4458149 (1984-07-01), Muga
patent: 5032722 (1991-07-01), Boesl et al.
patent: 5073713 (1991-12-01), Smith et al.
patent: 5144127 (1992-09-01), Williams et al.
patent: 5196708 (1993-03-01), Mullock
patent: 5396065 (1995-03-01), Myerholtz et al.
Dodonov et al, Electrospray Ionization on a Reflecting Time-of-Flight Mass Spectrometer, ACS Book (1993).
Houk, R.S., Anal. Chem., vol. 58, No. 1, p. 97A (1986).
Kutscher et al., A Transversally & Longitudinally Focusing Time-of-Flight Mass Spectrometer, Journal of Mass Spectrometry Ion Physics, vol. 103, p. 117 (1991).
Wiley and McLaren, Rev. Sci. Instrum., vol. 26, p. 1150 (1955).
Mamyrin et al., Soviet Physics, J.E.P.T., vol. 37, p. 45 (1973).
Benninghoven et al., Organic Mass Spectrometry, vol. 12, p. 593 (1977).
Karas et al., Intertnational Journal of Mass Spectrometry Ion Proceedings, vol. 92, p. 231 (1989).
O'Harleron et al., Technical Document Report No. ASD TDR 62-644, Parts I and II (1964).
Sin et al., Analytical Chemistry, vol. 63, p. 2897 (1991).
Dodonov et al., Book of Abstracts from the Twelfth International Mass Spectrometry Conference, Amsterdam (1991).
Coles et al., Proceedings of the Fortieth ASMS Conference on Mass Spectrometry and Applied Topics vol. 10 (1992).
Boyle et al., Analytical Chemistry, vol. 64, p. 2084 (1992).
Myers and Hieftje, Michrochemical Journal (1993).
Cameron, A.E.; Eggers, D.F.; Rev. Sci. Instrum., vol. 19, p. 605 (1948).
Futrell et al., Modification of Time-of-Flight Mass Spectrometer for Investigation of Ion-Molecule Reations at Elevated Pressures, Rev. Sci. Instrum., vol. 39, No. 3, p. 340 (1968).
Miller et al., Improvement of Spectral Baseline Stability for a Time-of-Flight Mass Spectrometer Operated at Elevated Pressures, Rev. Sci. Instrum., vol. 40, p. 503 (1969).
Studier, Martin, Continuous ION Source for a Time-of-Flight Mass Spectrometer Rev. Sci. Instrum., vol. 34, No. 12 p. 1367 (1963).
Di Valentin and Dove, Satellite Mass Peaks in Time-of-Flight Mass Spectrometry of Ions Continuously Sampled From an External Source, International Journal of Mass Spectrometry and Ion Physics, p. 359 (1973).
Fowler and Good, A Theory on Obtaining Short Bursts of Ions from a Beam of Ions, Nuclear Instruments and Methods, vol. 7, p. 245 (1960).
Sanzone, George, Energy Resolution of the Conventional Time-of-Flight Mass Spectrometer Rev. Sci. Instrum., vol. 41, No. 3, p. 741 (1970).
Pinkston et al., New Time-of-Flight Mass Spectrometer for Improved Mass Resolution, Versatility, and Mass Spectrometry/Mass Spectrometry Studies, Rev. Sci. Instrum., vol. 57 (4), p. 583 (1986).
Cotter, R.G., Electrospray Ionization on a Reflecting Time-of-Fligh Mass Spectrometer, ACS Book (1994).
Gohl et al., Time-of-Flight Mass Spectrometry for Ions of Large Energy Spread, International Journal of Mass Spectrometry and Ion Physics, vol. 48, p. 411 (1983).
Boesl, et al., A High-Resolution Time-of-Flight Mass Spectrometer with Laser Desorption and a Laser Ionization Source, Analytical Instrumentation, vol. 16(1), p. 151 (1987).
Bakker, J. M. B., A Beam-Modulated Time-of-Flight Mass Spectrometer Part I: Theoretical Considerations, Scientic Instruments, vol. 6, No. 8, p. 677 (1973).
Mamyrin and Shmikk, The Linear Mass Reflection, Soviet Physics, J.E.P.T., vol. 49(5) (1979).
Bakker, J.M.B., A Beam-Modulated Time-of-Flight Mass Spectrometer; Part II Expiremental Work, Scientific Instruments, vol. 7, No. 5, p. 364 (1974) .
Yefchak et al., Beam Deflection for Temporal Encoding in Time-of-Flight Mass Spectrometry, Journal of American Society for Mass Spectrometry. vol. 1, No. 6 (1990).
Ma, C. et al., The Design of an Atmospheric Pressure Ionization/Time-of-Flight Mass Spectrometer Using a Beam Deflection Method, Rev. Sci. Instrum., vol. 63, p. 139 (1992).
Van Breemen et al., Time-Resolved Laser Desorption Mass Spectrometry, Journal of Mass Spectrometry and Ion Physics, vol. 49, No. 1 (1983).
Olthoff et al., Liquid Secondary Ion Time-of-Flight Mass Spectrometry, Analytical Chemistry, (1987).
Bergmann et al., High-Resolution Time-of-Flight Mass Spectrometer, Rev. Sci. Instrum., vol. 60, No. 4 (1989).
Grix, et al., A Time-of-Flight Mass Analyzer wityh High Resolving Power, Physikalisches Institut Der Justus-Liebig-Universitat, West Germany (1988).
Karataev et al., New Method for Focusing Ion Bunches in Time-of-Flight Mass Spectrometers, Soviet Physics--Technical Physics, vol. 16, No. 7 (1972).
Bakker, J.M.B., The Time-Focusing Principle: A Double-Focusing Design for Time-of-Flight Mass Spectrometers, Journal of Mass Spectrometry and Ion Physics, vol. 6, No. 314 (1971).
Poschenrieder, W.P., Multiple-Focusing Time-of-Flight Mass Spectrometers Part II: TOFMS with Equal Energy Acceleration, Journal of Mass Spectrometry and Ion Physics, vol. 9, No. 4 (1972).
Kinsel and Johnston, Post Source Pulse Focusing: A Simple Method to Achieve Improved Resolution in a Time-of-Flight Mass Spectrometer, Int'l Journal of Mass Spectrometry and Ion Processes, vol. 91 (1989).
Dawson and Guilhaus, Orthogonal-Acceleration Time-of-Flight Mass Spectrometer, Rapid Communications in Mass Spectrometry, vol. 3, No. 5 (1989).

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