Time of flight mass spectrometer

Details Time of flight mass spectrometer Time of flight mass spectrometer

2008-04-22

2008-04-22

Berman, Jack I. (Department: 2881)

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

Reexamination Certificate

active

11390109

ABSTRACT:
The present invention relates to a time of flight mass spectrometer (TOFMS) having a flight space in which ions to be analyzed repeatedly fly in a loop orbit or reciprocal path. In an example of the present invention, the TOFMS carries out two rounds of measurement for one sample under two conditions differing in the effective flight distance of the ions to create two flight time spectrums. The data processor of the TOFMS compares the central points of the peaks in the two spectrums to identify peaks that have resulted from the same kind of ion (Step S3). If any peak is found to be unidentifiable (“No” in Step S4), the data processor examines the similarity of the peak shapes (e.g. half-value width) to identify peaks that have resulted from the same kind of ion (Step S5). After the correspondence of all the peaks have been determined, the data processor calculates the approximate mass to charge ratio of each ion from the difference in flight time (Step S6) and determines the number of turns of the ion based on the approximation (Step S7). Finally, it calculates the exact mass to charge ratio, using the number of turns and the flight time (Step S8). Thus, even if the sample contains many components and the spectrums accordingly have many peaks mixed together, the TOFMS can identify all the peaks.

REFERENCES:
patent: 6300625 (2001-10-01), Ishihara
patent: 6906321 (2005-06-01), Yamaguchi
patent: 6949736 (2005-09-01), Ishihara
patent: 11-135060 (1999-05-01), None
patent: 2006-12747 (2006-01-01), None
patent: 2006-012747 (2006-01-01), None

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