Time-of-flight mass spectrometer

Details Time-of-flight mass spectrometer Time-of-flight mass spectrometer

2006-04-25

2006-04-25

Lee, John R. (Department: 2881)

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

C250S287000, C250S281000

Reexamination Certificate

active

07034288

ABSTRACT:
A time-of-flight mass spectrometer capable of cutting out a major portion of carrier gas-derived ions ahead of the ion reservoir. The ion source is of the electron impact type and has source magnets for deflecting some of the produced ions away from the center axis of the ion reservoir. Electrostatic lenses for promoting the deflection of the ions caused by the source magnets and a differentially pumped slit for cutting off the deflected ions are mounted downstream of the ion source.

REFERENCES:
patent: 5763878 (1998-06-01), Franzen
patent: 6294780 (2001-09-01), Wells et al.
patent: 6515279 (2003-02-01), Baykut
patent: 6600155 (2003-07-01), Andrien et al.
patent: 52-087086 (1977-07-01), None
patent: 62-168328 (1987-07-01), None

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