Time of flight mass spectrometer

Details Time of flight mass spectrometer Time of flight mass spectrometer

1982-09-03

1984-12-25

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

250288, B01D 5944

Patent

active

044906102

ABSTRACT:
A time-of-flight mass spectrometer is described in which ions are desorbed from a sample by nuclear fission fragments, such that desorption occurs at the surface of the sample impinged upon by the fission fragments. This configuration allows for the sample to be of any thickness, and eliminates the need for complicated sample preparation.

REFERENCES:
patent: 3868507 (1975-02-01), Panitz
patent: 4178507 (1979-12-01), Brummee et al.
patent: 4296322 (1981-10-01), Wechsung
"A Measurement Method of TOF of Charged Particles", Andrade et al., Nucl. Inst. and Methods, 121, No. 2, 1974, pp. 359-363, 250-287.
"Californium-252 Plasma Desorption Mass Spectroscopy", Macfarlane et al., Science, vol. 191, pp. 920-925, Mar. 1976.
"252 CF-Plasma Desorption TOF Mass Spect.", Macfarlane et al., International Jour. of Mass Spectrometry and Ion Physics, vol. 21, pp. 81-92, 1976.

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