Radiant energy – Ionic separation or analysis – Ion beam pulsing means with detector synchronizing means
Patent
1991-10-25
1992-11-03
Anderson, Bruce C.
Radiant energy
Ionic separation or analysis
Ion beam pulsing means with detector synchronizing means
250282, B01D 5944, H01J 4900
Patent
active
051608405
ABSTRACT:
A time-of-flight mass spectrometry and method of operating a TOF mass spectrometer are disclosed. The mass spectrometer includes one or more electrically charged accelerating plates for accelerating ions, a reflector, a first ion drift region upstream from the reflector, a second ion drift region downstream from the deflector, and an ion detector. The ion reflector includes a primary reflecting field for decelerating ions and reflecting low energy ions, and a second reflecting field for reflecting high energy ions and for establishing a substantially uniform ion flight time through the one or more accelerating fields and reflecting fields. According to the method of the present invention, the length of the ion drift regions may be adjusted such that ion travel time through these regions is equal to the ion travel time through the accelerating and reflecting fields. The second reflecting field downstream from the primary electrical field is adjusted such that high energy ions spend additional time in the second reflecting field compared to low energy ions to compensate for the shorter time high energy ions spend in the accelerating field and drift-free regions. The concepts of the present invention may be used with various techniques for producing ions, and ions may be formed in pulses by selectively activating a laser source, or formed in an ion beam pulsed toward the reflector by selectively activating the one or more of the accelerated fields.
REFERENCES:
patent: 3727047 (1973-04-01), James
patent: 4731532 (1988-03-01), Frey et al.
patent: 4733073 (1988-03-01), Becker et al.
patent: 4778993 (1988-10-01), Waugh
patent: 4883958 (1989-05-01), Vestal
patent: 5032722 (1991-07-01), Boesl et al.
patent: 5045694 (1991-09-01), Beavis et al.
Article, "A Secondary Ion Time-of-Flight Mass Spectrometer With an Ion Mirror", International Journal of Mass Spectrometry and Ion Processes, 85 (1988) 43-67.
Article, "The Mass-Reflection, a New Nonmagnetic Time-of-Flight Mass Spectrometer with High Resolution", Sov. Phys. JETP, vol. 37, No. 1, 1973, pp. 44-48.
Article, "Time of Flight Mass Spectrometry with Various Desorption Probes", Y Le Beyec, pp. 126-145.
Article, "Mestastable Decay of Peptides and Proteins in Matrix-Assisted Laser-Desorption Mass Spectrometry", Rapid Communications in Mass Spectrometry, vol. 5, 198-202 (1991).
Article, "The Review of Scientific Instruments", Retarding Field Energy Analyzers, vol. 32, No. 12, Dec. 1961, pp. 1283-1293.
Article, "Time-of-Flight Mass Spectrometry for Ions of Large Energy Spread", W. Gohl et al., 1983 Elsevier Scientific Publishing Company.
LandOfFree
Time-of-flight analyzer and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Time-of-flight analyzer and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Time-of-flight analyzer and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2051804