Time measurement method using quadrature sine waves

Details Time measurement method using quadrature sine waves Time measurement method using quadrature sine waves

2006-08-01

2006-08-01

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S072000, C702S078000, C702S176000, C714S700000

Reexamination Certificate

active

07085668

ABSTRACT:
A time measurement circuit includes N time stamping units that each includes a dual sinusoid interpolator for achieving high timing resolution. The time measurement circuit is capable of time stamping input signals at a high re-trigger rate, and is thus well suited for quickly measuring the timing jitter of test signals in automatic test systems.

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patent: 6609077 (2003-08-01), Brown et al.
Berry, Andrew “Dual Time To Digital Converter For Delay-Line Readout of Position-Sensitive Gas-Filled Detectors” American Institute of Physics, Rev. Sci,. Instrum. 64 (5), May 1993, pp. 1222-1228.
Lampton, M. and Raffanti, R., “A High-Speed Wide Dynamic Range Time-To-Digital Converter” American Institute of Physics, Rev. Sci,. Instrum. 65 (11), Nov. 1994, pp. 3577-3584.

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