Time interval measuring system

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377 20, G01R 2302

Patent

active

045232890

ABSTRACT:
A time interval measuring system, which is proposed for measuring in a digital memory, etc. a time interval between two time points meeting with measurement conditions indicative of two kinds of optionally presettable threshold levels, polarities and the numbers of slopes in a digital value train converted from an analog signal.

REFERENCES:
patent: 4041288 (1977-08-01), Conway et al.
patent: 4165459 (1979-08-01), Curtice
patent: 4176337 (1979-11-01), Aechter et al.
patent: 4192130 (1980-03-01), Takeuchi
patent: 4216463 (1980-08-01), Backof, Jr. et al.
High-Speed Device for Time Interval Measurement; Kovrigin et al; Plenum Publishing Corp., 1979, pp. 484-486.
Programmable Event Time, Stehens, IBM Technical Disclosure Bulletin, vol. 22, No. 2, Jul. 1979, pp. 785-786.

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