Time domain reflectometry measurement instrument

Details Time domain reflectometry measurement instrument Time domain reflectometry measurement instrument

2005-06-14

2005-06-14

Nguyen, Tu T. (Department: 2877)

Communications: directive radio wave systems and devices (e.g.,

Determining distance

Material level within container

Reexamination Certificate

active

06906662

ABSTRACT:
A time domain reflectometry measuring instrument uses a microprocessor that provides added functionality and capabilities. The circuit electronics and probe are tested and calibrated at the factory. Installation and commissioning by the user is simple. The user installs the probe. The transmitter is attached to the probe. The user connects a standard shielded twisted pair to the electronics. Power is applied and the device immediately displays levels. A few simple parameters may need to be entered such as output characteristics and the process material dielectric constant.

REFERENCES:
patent: 5361070 (1994-11-01), McEwan
patent: 5457394 (1995-10-01), McEwan
patent: 5465094 (1995-11-01), McEwan
patent: 5650728 (1997-07-01), Rhein et al.
patent: 5672975 (1997-09-01), Kielb et al.
patent: 6104200 (2000-08-01), Hook
patent: 6121780 (2000-09-01), Cruickshank et al.

Affiliated with

Also associated with

Rating

Time domain reflectometry measurement instrument does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Time domain reflectometry measurement instrument, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Time domain reflectometry measurement instrument will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3488231