Time domain delay measurement apparatus and associated method

Measuring and testing – Gas content of a liquid or a solid – By vibration

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

73 2406, 73 3106, 73 5441, 73 6179, 73 6453, 310313B, 310313D, G01N 3100, H01L 4108, A61B 800

Patent

active

057009520

ABSTRACT:
An embodiment of a sensing apparatus includes an ultrasonic delay sensor having a delay related to the sensed quantity; and a time domain analysis circuit for recirculating pulses through the ultrasonic delay sensor or device and for generating the output signal related to the sensed quantity. In particular, the time domain analysis circuit may include a pulse generator for generating a series of input pulses to the ultrasonic delay sensor; a pulse detector for detecting a series of output pulses after propagation through the ultrasonic delay sensor; and a pulse recirculating circuit for causing the pulse generator to generate the series of input pulses based upon respective previously detected output pulses from the pulse detector. The apparatus also preferably includes circuits for suppressing the undesirable reflections generated by the ultrasonic delay sensor. For example, random phase switching may be used for randomly switching phases of the series of input pulses to the ultrasonic delay sensor to thereby reduce undesired reflections. In addition, a fixed delay may be operatively connected between the pulse detector and the pulse generator. Also time diversity matching to the ultrasonic delay device may also be used to suppress the effects of undesired reflections. Method aspects of the invention are also disclosed.

REFERENCES:
patent: 3596182 (1971-07-01), Menard
patent: 3906213 (1975-09-01), Meriaux et al.
patent: 4312228 (1982-01-01), Wohltjen
patent: 4315228 (1982-02-01), Moore
patent: 4512198 (1985-04-01), Sinha et al.
patent: 4534223 (1985-08-01), Sinha et al.
patent: 4598224 (1986-07-01), Ballato
patent: 4691714 (1987-09-01), Wong et al.
patent: 4895017 (1990-01-01), Pyke et al.
patent: 4905701 (1990-03-01), Cornelius
patent: 4995019 (1991-02-01), Begin
patent: 5012668 (1991-05-01), Haworth
patent: 5076094 (1991-12-01), Frye et al.
patent: 5117146 (1992-05-01), Martin et al.
patent: 5129262 (1992-07-01), White et al.
patent: 5235235 (1993-08-01), Martin et al.
patent: 5283037 (1994-02-01), Baer et al.
patent: 5289715 (1994-03-01), Staples et al.
patent: 5323636 (1994-06-01), McGowan et al.
patent: 5325704 (1994-07-01), Mariani et al.
patent: 5384541 (1995-01-01), Chu et al.
patent: 5476002 (1995-12-01), Bowers et al.
N.R. Karpov, Yu. D. Matyukhin, & N.N. Povarenkin, "Time-Interval Measurement by Regressive Coincidence" (Jan. 1980, Instruments & Experimental Techniques, pp. 1317-1318).
V.P. Voronov, V.M. Malyshev, & V.M. Merkulov, "Time-Delay Measuring Circuit for a Wave Pulse Used in Acoustic Experiments" (Jul. 1980, Instruments & Experimental Techniques, pp. 172-173).
R.A. Zakarevicius, E.H. Fooks & C.J.E. Phillips, "The Integrator as a Time Delay Estimator" (ICASSP 86, Tokyo, pp. 1861-1864).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Time domain delay measurement apparatus and associated method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Time domain delay measurement apparatus and associated method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Time domain delay measurement apparatus and associated method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1803793

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.