Time delay evaluation

Details Time delay evaluation Time delay evaluation

2006-12-05

2006-12-05

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Statistical measurement

C257S200000, C348S192000, C702S176000, C702S178000

Reexamination Certificate

active

07146289

ABSTRACT:
The invention concerns a method to evaluate whether a statistical time delay (TD) between a first event and a second event of a device under test is better than a test limit (TL). The method includes the steps: performing a minimum number N of tests and evaluating the time delay (TD) from each test; modeling a first probability distribution (P1) of the evaluated time delays (TD); obtaining a second probability distribution (P2) of the evaluated time delays (TD); performing a statistical transformation in order to obtain a third probability distribution (P3) of the evaluated time delays (TD); and deciding to pass the device under test, if a certain percentage of the area of the third probability distribution (P3) is on a good side (GS) of the test limit (TL2).

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