Tilt free micromotion translator

Optics: measuring and testing – By particle light scattering – With photocell detection

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356346, G01B 902

Patent

active

057216169

ABSTRACT:
An apparatus for providing tilt-free, linear micromotion translation of an object (12), such as an optical element, relative to a fixed rigid frame member (2) includes a flexural suspension (7) connected to the object (12) for enabling motion of the object (12) along a predetermined translational axis (18). The flexural suspension (7) includes a plurality of flexural links (14, 15) connecting a plurality of points (9) on the fixed rigid frame member (2) to a plurality of points (10) on a moving rigid frame member (11) with the links (14, 15) and the points (9, 10) connected by the links (14, 15) lying in a pair of parallel planes with an arrangement of links (14, 15) and fixed (9) and moving (10) points being disposed in each of the parallel planes and with the translational axis (18) being normal to the pair of parallel planes. The arrangements of the fixed (9) and moving (10) points are, disposed in the parallel planes for minimizing any undesirable cross axis translational motions (16, 17, 18) of the object (12). The apparatus also includes a linear motion transducer (32) and a drive mechanism (31) coupling linear motion transducer (32) to the flexural suspension (7) for enabling the tilt-free, linear micromotion translation of the object (12).

REFERENCES:
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patent: 4577131 (1986-03-01), Soobitsky
patent: 4884003 (1989-11-01), Hayes
patent: 5239361 (1993-08-01), Burch
R.V. Jones, "Instruments and Experiences: Papers on Measurement & Instrument Design", pp. 87-144 (John Wiley & Sons, 1988).
J.H. Bruning, et al, "Digital Wavefront Measuring Interferometer For Testing Optical Surfaces & Lenses", pp. 2693-2703 (Applied Optics, vol. 13, No. 11, Nov. 1974).
M. Schaham, "Precision Optical Wavefront Measurement", pp. 183-191 (SPIE vol. 306, Contemporary Methods of Optical Fabrication, 1981).
H.Z. Hu, "Polarization Heterodyne Interferometry Using a Simple Rotating Analyzer 1: Theory and Error Analysis", pp. 2052-2056, Applied Optics) vol. 22, No. 13, Jul. 1983.

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