Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1995-01-06
1996-08-06
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
G01B 1124
Patent
active
055439187
ABSTRACT:
Apparatus and method for measuring a change in the height of a surface or the distance between two surfaces. The invention involves converging a light beam having a beam axis and a focus onto the said surface; scanning the focus of the light beam across the surface along the beam axis using a scanning means; measuring intensity of light reflected from the surface during the scanning; determining a maximum of the light intensity; assigning to the maximum of the light intensity a position of the scanning means; repeating these steps to monitor a change in the position of the scanning means assigned to the maximum of the light intensity; and correlating such change in the position of the scanning means to a change in the height of the surface.
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Abraham David W.
Wong Danny C. Y.
International Business Machines - Corporation
Pham Hoa Q.
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