Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent
1988-01-13
1989-08-15
Hudspeth, David
Electrical transmission or interconnection systems
Nonlinear reactor systems
Parametrons
307448, 307577, 3072961, H03K 1714
Patent
active
048577693
ABSTRACT:
This invention relates to a threshold voltage detection circuit for detecting the threshold voltage of field effect transistors (FETs) and to a semiconductor circuit capable of a stable operation irrespective of the fluctuation of the threshold voltage by utilizing this threshold voltage detection circuit. The source-drain path of first FET is connected in series with that of second FET having substantially the same threshold voltage as that of the first FET and the conductances of these first and second FETs are set to a predetermined ratio to generate a voltage drop associated with the threshold voltage in the first FET. This voltage drop can be used for detecting the threshold voltage and for level-shifting. The output of the series connection of the first and second FETs is applied to the gate of a constant current FET having the same threshold voltage as that of the first and second FETs and the drain current of the constant current FET can thus be set irrespective of the fluctuation of the threshold voltage.
REFERENCES:
patent: 3986060 (1976-10-01), Nishizawa et al.
patent: 4609833 (1986-09-01), Guterman
patent: 4661726 (1987-04-01), Biard
patent: 4760284 (1988-07-01), Taylor
patent: 4760288 (1988-07-01), Peczalski
Kinoshita Taizo
Kotera Nobuo
Nagata Minoru
Tanaka Hirotoshi
Tanaka Satoshi
Hitachi , Ltd.
Hudspeth David
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