Three-dimensional shape measuring method and its device

Details Three-dimensional shape measuring method and its device Three-dimensional shape measuring method and its device

2003-11-13

2008-03-11

Punnoose, Roy M. (Department: 2886)

Optics: measuring and testing

Shape or surface configuration

Triangulation

C356S602000

Reexamination Certificate

active

07342669

ABSTRACT:
A three-dimensional shape is measured by a simple system structure. A three-dimensional shape measuring instrument comprises a device (1-1) in which a light-emitting diode (1-1b) is installed as a marker in a line laser light source (1-1a), an imaging device (1-2), and a computer (1-3). For measurement, a line laser beam from the device (1-1) is applied to an object (1-4) to be measured, the imaging device (1-2) images the applied line laser beam (1-5) and the light-emitting diode, and a three-dimensional shape is obtained from the image data by triangulation by means of the computer (1-3).

REFERENCES:
patent: 6195455 (2001-02-01), Mack et al.
patent: 2003/0137510 (2003-07-01), Massen
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patent: WO 97/14015 (1997-04-01), None
Masahiro Takatsuka, Geoff A.W. West, Svetha Venkatesh, and Terry M. Caelli, “Low-cost Interactive Active Monocular Range Finder,” Proceeding of Computer Vision and Pattern Recognition, vol. 1, pp. 444-449, 1999).

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