Image analysis – Applications – 3-d or stereo imaging analysis
Reexamination Certificate
2004-06-03
2009-12-08
Chawan, Sheela C (Department: 2624)
Image analysis
Applications
3-d or stereo imaging analysis
C382S165000, C250S574000, C348S086000
Reexamination Certificate
active
07630537
ABSTRACT:
A 3-D shape measurement apparatus for grasping the state of an object with ease and accuracy is provided. The 3-D shape measurement apparatus includes: a first 3-D sensor10ahaving a projecting device11for projecting a light pattern on a target area, and a (first) image capturing apparatus12aplaced at a first interval d1from the projecting device11to capture an image of the target area on which the light pattern is projected; a second 3-D sensor10bhaving a projecting device11, and a (second) image capturing apparatus12bplaced at a second interval d2longer than the first interval d1from the projecting device11to capture an image of the target area on which the light pattern is projected; 3-D information computing means22for obtaining external shape information on an object2based on the shift of the pattern on the image acquired with the first 3-D sensor10a; variation information computing means23for obtaining variation information on the object2based on the shift of the pattern on the image acquired with the second 3-D sensor10b; and information composing means24for composing the external shape information and the variation information.
REFERENCES:
patent: 4882566 (1989-11-01), Koerber et al.
patent: 4947152 (1990-08-01), Hodges
patent: 5471198 (1995-11-01), Newham
patent: 5479939 (1996-01-01), Ogino
patent: 5528339 (1996-06-01), Buhr et al.
patent: 5761337 (1998-06-01), Nishimura et al.
patent: 5914660 (1999-06-01), Mesibov et al.
patent: 6011477 (2000-01-01), Teodorescu et al.
patent: 6011595 (2000-01-01), Henderson et al.
patent: 6049281 (2000-04-01), Osterweil
patent: 6075883 (2000-06-01), Stern et al.
patent: 6965690 (2005-11-01), Matsumoto
patent: 7106885 (2006-09-01), Osterweil et al.
patent: 7110596 (2006-09-01), Brodsky et al.
patent: 7167575 (2007-01-01), Nichani et al.
patent: 7431700 (2008-10-01), Aoki et al.
patent: 7545279 (2009-06-01), Sato et al.
patent: 2 430 535 (2002-06-01), None
patent: 0 919 184 (1999-06-01), None
patent: 1 350 466 (2003-10-01), None
patent: 1 410 755 (2004-04-01), None
patent: 2002-122416 (2002-04-01), None
patent: 2002-131017 (2002-05-01), None
patent: 2002-175582 (2002-06-01), None
patent: 2003-32672 (2003-01-01), None
patent: 3689720 (2005-06-01), None
patent: 3922694 (2007-03-01), None
patent: 3979238 (2007-07-01), None
I. Sato et al., U.S. PTO Notice of Allowance, U.S. Appl. No. 10/560,027, dated Feb. 10, 2009, 6 pgs.
I. Sato et al., U.S. PTO Office Action, U.S. Appl. No. 10/560,027, dated Jan. 14, 2008, 10 pgs.
I. Sato et al., U.S. PTO Office Action, U.S. Appl. No. 10/560,027, dated Jun. 2, 2008, 8 pgs.
Aoki Hirooki
Katou Kei
Mimura Kazuhiro
Nakajima Masato
Sato Isao
Chawan Sheela C
Foley & Lardner LLP
Keio University
Sumitomo Osaka Cement Co. Ltd.
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