Three-dimensional shape measuring apparatus

Details Three-dimensional shape measuring apparatus Three-dimensional shape measuring apparatus

1987-08-06

1989-02-07

Rosenberger, Richard A.

Optics: measuring and testing

By polarized light examination

With light attenuation

356 1, 364560, G01B 1124

Patent

active

048027596

ABSTRACT:
A three-dimensional shape measuring apparatus includes a projection device having a projecting plane witha grating pattern formed therein and a light source for illuminating, through the projection plane, an object of interest located at an arbitrary position in the same three-dimensional coordinate system as that of the projection device, an observation device located in the same three-dimensional coordinate sysem as that of the object and having an observation plane and a specific point located between the observation plane and the object. In the apparatus, the grating pattern in the projection plane is projected on a surface of the object to form a projected grating pattern thereon when the light source is turned on, the grating pattern projected on the object is observed in the observation plane. The three-dimensional coordinates of an arbitrary sample point on the projected grating line on the object are determined by utilizing the fact that a sample point on the object is an intersection between a light ray emitted from the light source of the projection device and illuminating the sample point on the object and a line including the specific point of the observation device and the sample point in the observation plane, thereby measuring a three-dimensional shape of the object.

REFERENCES:
patent: 4349277 (1982-09-01), Mundy et al.
patent: 4452534 (1984-06-01), Gribanov et al.
patent: 4559684 (1985-12-01), Pryor
patent: 4641972 (1987-02-01), Halioua et al.
patent: 4668094 (1987-05-01), Matzumoto et al.

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