Optics: measuring and testing – Shape or surface configuration
Reexamination Certificate
2008-06-24
2008-06-24
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Shape or surface configuration
C356S603000
Reexamination Certificate
active
07391522
ABSTRACT:
A three-dimensional shape detecting means includes a projecting device which projects pattern light; an image capturing device which captures a pattern light projection image; a pattern light position extracting device which extracts a position of the pattern light projected on the subject; a three-dimensional shape calculation device which calculates three-dimensional shape of the subject; a storage device which stores color value data of the pattern light projection image; a hue parameter calculation device which calculates hue parameters corresponding to a main hue; a luminance parameter calculation device which calculates luminance parameters in units of pixels; and a pattern light detecting device which detects pixels representing the pattern light. The pattern light position extracting device extracts the position of the pattern light based on the pixels representing the pattern light detected by the pattern light detecting device.
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Brother Kogyo Kabushiki Kaisha
Oliff & Berridg,e PLC
Toatley , Jr. Gregory J.
Underwood Jarreas C
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