Geometrical instruments – Gauge – With support for gauged article
Patent
1996-11-26
1998-09-15
Bennett, G. Bradley
Geometrical instruments
Gauge
With support for gauged article
33553, 33557, G01B 520
Patent
active
058061991
ABSTRACT:
A three-dimensional part measurement system includes a base; at least two guides in the base extending along a first dimension of the part to be measured; a carriage; at least three followers supporting the carriage and movable along the guides to follow the part in the first dimension; and a first gauge mounted on the carriage for measuring deviations of the part in a second dimension and a second gauge mounted on the carriage for measuring deviation of the part in a third dimension.
REFERENCES:
patent: 2593986 (1952-04-01), Comstock
patent: 3323220 (1967-06-01), Crist et al.
patent: 3597849 (1971-08-01), Gaal
patent: 3708885 (1973-01-01), Christ
patent: 4122607 (1978-10-01), Hopf
patent: 4322887 (1982-04-01), Burton
patent: 4554747 (1985-11-01), Williams
patent: 4603487 (1986-08-01), Matsunata
patent: 4718172 (1988-01-01), Rouse et al.
patent: 4953306 (1990-09-01), Weckenmann et al.
patent: 5009512 (1991-04-01), Lessi et al.
patent: 5276974 (1994-01-01), Chanoni et al.
patent: 5301436 (1994-04-01), Johnston
patent: 5343627 (1994-09-01), Hesseltine
patent: 5515615 (1996-05-01), Twigg et al.
Bennett G. Bradley
Everett Pattern & Manufacturing Inc.
LandOfFree
Three-dimensional part measurement system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Three-dimensional part measurement system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Three-dimensional part measurement system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-76442