Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Multiple housings
Reexamination Certificate
2007-07-03
2007-07-03
Vu, Hung (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
Multiple housings
C257S048000, C257S737000, C257S777000, C257S778000
Reexamination Certificate
active
10951990
ABSTRACT:
A pre-formed integrated circuit chip-containing module formed from layers is disclosed. Each layer contains an integrated circuit chip that is encapsulated into an electronic package, by forming an interconnect assembly separately from the pre-formed integrated circuit chip. If the interconnect assembly tests good it is bonded to the prepared integrated circuit chip. The interconnect assembly is flip bonded to the chip. The interconnect assembly and chip are passivated or potted into an integral structure to provide the electronic package. At least one test pad is defined in an interconnect layer, which test pad can be accessed and electrically connected on opposing sides of the test pad. The chip is underfilled with an insulating material to remove all voids between the chip and the interconnect assembly. The integrated circuit chip is then thinned. The test pad is accessed to test the chip. A plurality of interconnect assemblies and chips are bonded together to form a corresponding plurality of electronic packages. Each layer is bonded to form a stack of integrated circuit containing layers.
REFERENCES:
patent: 6548330 (2003-04-01), Murayama et al.
Pepe Angel
Yamaguchi James
Boyd, Esq. W. Eric
Irvine Sensors Corp.
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