Three-dimensional microscope and method for obtaining...

Optics: measuring and testing – By light interference – Having wavefront division

Reexamination Certificate

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C356S511000, C250S23700G

Reexamination Certificate

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07633631

ABSTRACT:
A microscope which has a high three-dimensional resolution, does not require specimens to be stained and is easy to operate, is presented. The three-dimensional microscope includes a first optical system for illuminating an object with lights in a plurality of illuminating directions, one direction after another; an imaging section; a second optical system for guiding diffracted lights generated by the object and reference lights to the imaging section that obtains interference images of the diffracted lights and the reference lights; and a processor for generating a three-dimensional image using the interference images for respective illuminating directions, obtained by the imaging section. The processor obtains complex amplitudes of the diffracted lights from the interference images for respective illuminating directions and generates the three-dimensional image of the object from the complex amplitudes.

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Cuche, et al. “Simultaneous amplitude-contrast and quantitative phase-contrast microscopy by numerical reconstruction of Fresnel off-axis holograms”, Applied Optics, vol. 38, No. 34, Dec. 1, 1999, pp. 6994-7001.

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