Optics: measuring and testing – By light interference – Having wavefront division
Reexamination Certificate
2008-03-18
2009-12-15
Connolly, Patrick J (Department: 2877)
Optics: measuring and testing
By light interference
Having wavefront division
C356S511000, C250S23700G
Reexamination Certificate
active
07633631
ABSTRACT:
A microscope which has a high three-dimensional resolution, does not require specimens to be stained and is easy to operate, is presented. The three-dimensional microscope includes a first optical system for illuminating an object with lights in a plurality of illuminating directions, one direction after another; an imaging section; a second optical system for guiding diffracted lights generated by the object and reference lights to the imaging section that obtains interference images of the diffracted lights and the reference lights; and a processor for generating a three-dimensional image using the interference images for respective illuminating directions, obtained by the imaging section. The processor obtains complex amplitudes of the diffracted lights from the interference images for respective illuminating directions and generates the three-dimensional image of the object from the complex amplitudes.
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Connolly Patrick J
Morgan & Lewis & Bockius, LLP
Nikon Corporation
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