Three-dimensional microprobe array

Geometrical instruments – Gauge – Having a movable contact probe

Reexamination Certificate

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Details

C033S560000, C073S866500, C324S754070

Reexamination Certificate

active

07946050

ABSTRACT:
The present invention discloses a three-dimensional microprobe array assembly structure, wherein spacers are used in assembling edge-type microprobe arrays to form a three-dimensional structure, and the spacers reveal conductive pads of the edge-type microprobe arrays to benefit wire bonding. The present invention detects depths and angles and thus increases detection reliability. Besides, in the present invention, the related IC is integrated with the spacer to achieve circuit integration and reduce cost.

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