Optics: measuring and testing – Infrared and ultraviolet
Reexamination Certificate
2007-01-02
2007-01-02
Pert, Evan (Department: 2826)
Optics: measuring and testing
Infrared and ultraviolet
C365S063000, C257S211000
Reexamination Certificate
active
10967893
ABSTRACT:
The present invention provides a three-dimensional memory (3D-M) system-on-a-chip (SoC). It takes full advantage of the difference in the number of interconnect levels between the embedded processor (eP) and embedded memory (eM) in an SoC chip. The un-used interconnect space on top of the eM block is converted into 3D-M. This conversion incurs minimum additional cost, but with significant benefits: 3D-M can add a large storage capacity to the SoC chip and therefore the chip becomes more powerful.
REFERENCES:
patent: 5835396 (1998-11-01), Zhang
patent: 6034882 (2000-03-01), Johnson et al.
patent: 6385074 (2002-05-01), Johnson et al.
patent: 6717222 (2004-04-01), Zhang
patent: 6864585 (2005-03-01), Enquist
patent: 6948105 (2005-09-01), Rajsuman
patent: 2006/0097279 (2006-05-01), Zhang
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