Three-dimensional measuring system and method of measuring the s

Details Three-dimensional measuring system and method of measuring the s Three-dimensional measuring system and method of measuring the s

1997-11-18

2000-11-21

Pham, Hoa Q

Optics: measuring and testing

By polarized light examination

With light attenuation

G01B 1124

Patent

active

061511188

ABSTRACT:
A three-dimensional measuring system comprises an optical system for emitting a light and optically scanning an object, a measuring sensor having an image pickup surface consisting of a plurality of picture elements and adapted to receive the light reflected on the surface of the object, a galvanometer mirror for changing a direction in which the light irradiates the object, a system controller for driving the measuring sensor so as to allow the same to output information on the quantity of light incident on each of the picture elements, and a barycentric calculation circuit for finding an instant when the light traverses each of the picture elements. This instant is found by implementing a barycentric calculation on the basis of outputs of the measuring sensor taken for a prescribed period of time and an instant at which each of the outputs is taken. The measuring system further comprises a host computer for finding a position on the surface of the object corresponding to each of the picture elements. This position is found on the basis of a relationship between a direction in which the light irradiates the object at an instant when the light traverses each of the picture elements and a direction in which the light reflected on the surface of the object is incident on each of the picture elements.

REFERENCES:
patent: 4758093 (1988-07-01), Stern et al.
patent: 4794262 (1988-12-01), Sato et al.
patent: 4882490 (1989-11-01), Takasaki et al.
patent: 4939379 (1990-07-01), Horn
patent: 5024529 (1991-06-01), Svetkoff et al.
patent: 5102223 (1992-04-01), Uesugi et al.
patent: 5151599 (1992-09-01), Monnet et al.
patent: 5175595 (1992-12-01), Fukase
patent: 5362958 (1994-11-01), Ando
patent: 5661671 (1997-08-01), Ooenoki et al.
patent: 5668631 (1997-09-01), Norita et al.

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