Three-dimensional measuring system

Details Three-dimensional measuring system Three-dimensional measuring system

2005-11-08

2009-02-24

Nguyen, Sang (Department: 2886)

Optics: measuring and testing

Shape or surface configuration

C356S602000, C356S625000, C435S428000, C435S423000

Reexamination Certificate

active

07495776

ABSTRACT:
A three-dimensional measuring system for measuring a three-dimensional shape of a measurement object in a noncontact manner includes a first obtaining portion for obtaining arrangement information of the measurement object, a second obtaining portion for obtaining design shape information of the measurement object, a fourth obtaining portion for obtaining specifics information about one or more three-dimensional measuring devices, a determining portion for determining a measurable part that can be measured by the three-dimensional measuring device about a surface shape of the measurement object in accordance with the obtained arrangement information, the obtained design shape information and the obtained specifics information, and an output portion for outputting the determined measurable part.

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Japanese Official Communication dated Aug. 16, 2007 for corresponding Japanese patent application No. 2005-182185.

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