Optics: measuring and testing – Shape or surface configuration
Reexamination Certificate
2006-03-28
2006-03-28
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Shape or surface configuration
C356S613000, C356S625000, C250S559220, C250S559360, C382S101000, C382S149000
Reexamination Certificate
active
07019848
ABSTRACT:
For measuring the three-dimensional shape of an object of measurement using a phase shift method, a three-dimensional measuring instrument is provided which is capable of shortening the measurement time. A printed state inspection device1includes a table for placing a printed circuit board K printed with cream solder H, an illumination device3for illuminating three sine wave light component patterns with different phases on the surface of printed circuit board K, a CCD camera4for picking-up images of the illuminated part of the printed circuit board K, a white light illumination unit L for illuminating a white light on the surface of printed circuit board K, and a laser pointer for measuring the standard height. A control device7determines the existing area of the cream solder H from the image data obtained by the illumination of the white light, and calculates the height of the cream solder H from the image data obtained by the illumination device3by using a phase shift method.
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CKD Corporation
Muramatsu & Associates
Nguyen Sang H.
Toatley , Jr. Gregory J.
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