Three-dimensional measuring instrument

Details Three-dimensional measuring instrument Three-dimensional measuring instrument

2007-07-17

2007-07-17

Nguyen, Sang H. (Department: 2886)

Optics: measuring and testing

Shape or surface configuration

Triangulation

C356S613000, C356S625000, C250S559220, C382S149000

Reexamination Certificate

active

10505648

ABSTRACT:
For measuring the three-dimensional shape of an object of measurement using a phase shift method, a three-dimensional shortening the measurement time. A printed state inspection device1includes a printed circuit board K printed with cream solder H, an illumination device3for illuminating three sine wave light component patterns with different phases on the surface of printed circuit board K, and a CCD camera4for picking-up images of the illuminated part of the printed circuit board K. A control device7creates a chart representing a relationship between brightness and coordinates for each light component from the image data obtained by the illumination of the light component patterns and determines relative phase angles among the light component patterns, and calculates the height of the cream solder H from the image data and the relative phase angles.

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