Three-dimensional measuring device and three-dimensional measuri

Details Three-dimensional measuring device and three-dimensional measuri Three-dimensional measuring device and three-dimensional measuri

1996-11-13

2000-10-31

Rosenberger, Richard A.

Optics: measuring and testing

By polarized light examination

With light attenuation

G01B 1124

Patent

active

061411051

ABSTRACT:
This invention is related to a three-dimensional measuring device for measuring three-dimensional positions of an objects. The three-dimensional measuring device comprises an optical projection system and an optical reception system. In a preliminary measurement prior to an actual measurement, the optical projection system projects slit light beam on the object with varying projection angle with in a narrow range, and the optical reception system receives the slit light beam reflected by the object and generates image signals corresponding to an amount of the received light synchronously with variation of the projection angle. Measurement conditions including intensity of the light beam and the projection angle for the actual measurement are set in accordance with the image signals of the actual measurement. Under the measurement conditions, the actual measurement is executed by projecting the light beam on the object with varying the projection angle within a wide range.

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U.S. application No. 08/358,306, filed Dec. 19, 1994.

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