Three-dimensional measuring apparatus for scanning an object...

Optics: measuring and testing – Shape or surface configuration – Triangulation

Reexamination Certificate

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C356S003090, C356S141400, C250S591000, C250S201200

Reexamination Certificate

active

11107249

ABSTRACT:
An improved three-dimensional (3D) measuring apparatus for scanning an object and a measurement head of a measuring apparatus and a method for using the measuring apparatus for scanning an object.

REFERENCES:
patent: 4895440 (1990-01-01), Cain et al.
patent: 5137354 (1992-08-01), De Vos et al.
patent: 5546217 (1996-08-01), Greenway
patent: 5880828 (1999-03-01), Nakamura et al.
patent: 6560024 (2003-05-01), Akiyama et al.
patent: 6989890 (2006-01-01), Riegl et al.
patent: 2004/0021852 (2004-02-01), DeFlumere
patent: P 27 16 810 (1977-10-01), None
patent: 40 04 627 (1991-02-01), None
patent: 41 18518 (1992-10-01), None
patent: WO 2004/068211 (2004-08-01), None
Spectrochimica Acta,vol. 27B, pp. 295-300, 1972.
Bates, Charles;Hybrid CMM Makes Multiple Sense,American Machinist, Jun. 2003.

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